Mathias Schubert: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons

Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons



____________________________
Author: Mathias Schubert
Number of Pages: 196 pages
Published Date: 23 Nov 2010
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Publication Country: Berlin, Germany
Language: English
ISBN: 9783642062285
Download Link: Click Here
____________________________