Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons pdf
Par ortiz russell le mercredi, février 21 2018, 17:31 - Lien permanent
Mathias Schubert: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons
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Author: Mathias Schubert
Number of Pages: 196 pages
Published Date: 23 Nov 2010
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Publication Country: Berlin, Germany
Language: English
ISBN: 9783642062285
Download Link: Click Here
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